Quality Inspection Report: Electrical Transport Properties Measurement System
DX-3000S3 electrical transport property measurement system
Main function
Hall effect, magnetoresistance, and I-V characteristics can be tested under different magnetic fields.
Measurable parameters:
◆ Hall effect: sheet resistance, resistivity, Hall coefficient, conductivity type, Hall mobility, carrier concentration;
◆ Magnetoresistance: sheet resistance, resistivity;
◆ I-V characteristics: I-V characteristic curve, R-B curve, R-T curve.
Testable materials:
◆ Semiconductor materials: Si, Ge, GaN, AlGaAs, CdTe, HgCdTe;
◆ ferrite materials;
◆ Low resistance materials: metals, transparent oxides, weakly magnetic semiconductors, TMR materials.
Main technical parameters
◆ Magnetic induction intensity: 2.6T@10mm;
◆ Resistance range: 0.1mΩ~10MΩ;
◆ Current measurement: ±10pA~±1.05A (10pA is the minimum resolution);
◆ Voltage measurement: ±1nV~±100V (±1nV is the minimum resolution);
◆ Current source: ±50pA~±1A (±1.05A@+21V, ±105mA@+210V)
◆ Resistivity: 5×10-9 ~ 5×102Ω·cm;
◆ Migration rate: 1~1×106 cm2/vs;
◆ Carrier concentration: 6×1012~6×1023cm-3;
◆ Hall coefficient: ±1×10-5~±1×108cm3/C;
◆ 4K-325K, ±0.1K.
2.6T@10mm maximum magnetic induction intensity test
Resistance test
0.57mΩ , 10MΩ, InAs
Small resistance test: 0.57mΩ measurement stability
Large resistance test: 10MΩ measurement stability
Room temperature sample rod InAs Hall test
|
Current （mA） |
Thiness （cm） |
Field (kG) |
Temperature (K) |
Resistivity(Ω*cm) |
Hall coefficient (cm3*c-1) |
Carrier density (cm-3) |
Mobility (cm2*v-1*s-1) |
PN type |
|
1 |
0.01 |
1 |
287.56308 |
4.162370E+00 |
-1.776770E+04 |
3.512813E+14 |
4.268650 E+03 |
N |
|
1 |
0.01 |
2 |
287.564972 |
4.135819E+00 |
-1.777437E+04 |
3.511495E+14 |
4.297666 E+03 |
N |
|
1 |
0.01 |
3 |
287.563965 |
4.138581E+00 |
-1.778881E+04 |
3.508645E+14 |
4.298286 E+03 |
N |
|
1 |
0.01 |
4 |
287.564575 |
4.165817E+00 |
-1.780750E+04 |
3.504961E+14 |
4.274672 E+03 |
N |
|
1 |
0.01 |
5 |
287.563568 |
4.146999E+00 |
-1.783298E+04 |
3.499954E+14 |
4.300213 E+03 |
N |
|
1 |
0.01 |
6 |
287.564636 |
4.181114E+00 |
-1.786153E+04 |
3.494360E+14 |
4.271954 E+03 |
N |
|
1 |
0.01 |
7 |
287.567078 |
4.187685E+00 |
-1.789440E+04 |
3.487940E+14 |
4.273102 E+03 |
N |
|
1 |
0.01 |
8 |
287.571533 |
4.195337E+00 |
-1.793039E+04 |
3.480940E+14 |
4.273886 E+03 |
N |
|
1 |
0.01 |
9 |
287.572113 |
4.203570E+00 |
-1.797071E+04 |
3.473130E+14 |
4.275106E+03 |
N |
|
1 |
0.01 |
10 |
287.571259 |
4.212589E+00 |
-1.801278E+04 |
3.465018E+14 |
4.275940E+03 |
N |
Cryostat InAs Variable Temperature Hall Test
|
Current （mA） |
Thiness （cm） |
Field (kG) |
Temperature(K) |
Resistivity (Ω*cm) |
Hall coefficient (cm3*c-1) |
Carrier density (cm-3) |
Mobility (cm2*v-1*s-1) |
PN type |
|
1 |
0.01 |
10 |
3.976403 |
5.788794E+00 |
-2.346665 E+04 |
2.659715 E+14 |
4.053807 E+03 |
N |
|
1 |
0.01 |
10 |
9.936896 |
5.895913E+00 |
-2.378621 E+04 |
2.623983 E+14 |
4.034355 E+03 |
N |
|
1 |
0.01 |
10 |
29.971308 |
5.653729E+00 |
-2.330250 E+04 |
2.678451 E+14 |
4.121616 E+03 |
N |
|
1 |
0.01 |
10 |
60.012272 |
4.802939E+00 |
-2.326180 E+04 |
2.683137 E+14 |
4.843244 E+03 |
N |
|
1 |
0.01 |
10 |
100.068024 |
3.998614E+00 |
-2.296610 E+04 |
2.717683 E+14 |
5.743516 E+03 |
N |
|
1 |
0.01 |
10 |
150.077957 |
3.717721E+00 |
-2.170047 E+04 |
2.876186 E+14 |
5.837037 E+03 |
N |
|
1 |
0.01 |
10 |
200.08226 |
3.920357E+00 |
-2.083140 E+04 |
2.996178 E+14 |
5.313650 E+03 |
N |
|
1 |
0.01 |
10 |
250.074219 |
4.084289E+00 |
-1.929929 E+04 |
3.234037 E+14 |
4.725249 E+03 |
N |
|
1 |
0.01 |
10 |
300.065338 |
4.292155E+00 |
-1.814301 E+04 |
3.440146 E+14 |
4.227016 E+03 |
N |
|
1 |
0.01 |
10 |
325.057251 |
4.480245E+00 |
-1.790612 E+04 |
3.485658 E+14 |
3.996683 E+03 |
N |
Cooling and temperature control process of cryostat
|
283K to 4K takes about 1 hour |
Temperature control process, no obvious overshoot |
|
4K temperature control curve, stability within ±0.1K |
10K temperature control curve, stability within ±0.1K |
|
30K temperature control curve, stability within ±0.1K |
60K temperature control curve, stability within ±0.1K |
|
100K temperature control curve, stability within ±0.1K |
150K temperature control curve, stability within ±0.1K |
|
200K temperature control curve, stability within ±0.1K |
250K temperature control curve, stability within ±0.1K |
|
300K temperature control curve, stability within ±0.1K |
325K temperature control curve, stability within ±0.1K |
PID setting
PID setting
