DX-60 Hall Effect Measurement Instrument
DX-60 Hall device Instrument measures important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical characteristics of semiconductor materials. Therefore, the Hall effect test system is to understand and study semiconductor devices. And tools necessary for the electrical properties of semiconductor materials.
The software, and the bulk carrier concentration, surface carrier concentration, mobility, resistivity, Hall coefficient, magnetoresistance etc automatically calculate the experimental results.
The DX-320 effect meter specially developed for this instrument system assembles a constant current source, a six-and-a-half microvoltmeter and a Hall measuring complex switching relay-switch, which greatly reduces the connection and operation of the experiment. DX-320 can be used as a constant current source and a microvoltmeter alone
Parameters of DX-60 Hall Effect Measurement Instrument:
| Physical parameters |
Carrier concentration |
10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
|
Resistivity range |
10⁻⁷ Ohm*cm - 10¹² Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
|
Hall coefficient |
10⁻⁵ - 10²⁷cm³/ C | |
| Testable material type | Semiconductor material | SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc. |
| low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| high resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
| Magnetic field environment | Magnet Type | Variable electromagnet |
| Magnitude of magnetic field | 1070mT (The pole pitch is 10mm) 687mT (The pole pitch is 20mm) 500mT (The pole pitch is 30mm) 378mT (The pole pitch is 40mm) 293mT (The pole pitch is 50mm) |
|
| Uniform area | 1% | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
| Electrical parameters | Current source | 50.00nA- 50.00mA |
| Current source resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage measurement resolution | 0.0001 mV | |
| Other Accessories | Shading | Extern ally installed light-shielding parts make the test material more stable |
| Sample size | Maximum 10mm * 10mm | |
| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set (Si, Ge, GaAs, lnSb) |
|
| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
| One-button automatic measurement can be performed without the need for human operation after the test is started | ||
| The software can perform I-V curve and BV curve | ||
| Set in software for automatic temperature measurement | ||
| The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. | ||
| Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set | ||
Testable samples of Hall device Instrument:
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The Installation and Commissioning of the DX-60 Hall Effect Measurement System
