One-dimensional Vertical Magnetic Field Probe Station
Detailed parameter introduction
Model | DX1PS2 |
Mmagnetic field direction | Vertical |
Maximum magnetic field strength | >1.2T |
Is the air gap adjustable | The upper yoke can be removed |
Sample size | 20mm*20mm (4-inch wafer test can be upgraded) |
Air gap | 7mm |
Probe type and quantity | DC probes (4 sets)/microwave probes (4 sets) |
Sample Stage Parameters | XY axis movement stroke ± 15 mm, horizontal displacement adjustment accuracy 1um, T axis 5° fine adjustment |
Microscope type | monocular microscope |
Product description | One-dimensional magnetic field probe station, providing vertical magnetic field, the uniformity of magnetic field is ±1%@d2mm; Real-time monitoring and feedback of magnetic field strength, the monitoring accuracy is better than 1%, and the magnetic field resolution is better than 0.02mT; The magnetic yoke on the vertical magnet can be moved, which is convenient for microscope observation during needle sticking; It can satisfy 4 groups of DC probes for simultaneous testing, and 4 groups of microwave probes can be placed. |
Equipment can provide upgrade points | The sample multi-axis test stage is upgraded to semi-automatic; Probe plane fast lifting function; It can be upgraded to a 4-inch wafer magnetic field probe station. |
One-dimensional magnetic field probe station, providing vertical magnetic field, the uniformity of magnetic field is ±1%@d2mm;
Real-time monitoring and feedback of magnetic field strength, the monitoring accuracy is better than 1%, and the magnetic field resolution is better than 0.02mT;
Real-time monitoring and feedback of magnetic field strength, the monitoring accuracy is better than 1%, and the magnetic field resolution is better than 0.02mT;