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DX-FE2000-1
DX-FE2000-4
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TC-5
DXLV-03-1

Ferroelectric Test System

Many engineers of Dexinmag Company have developed the Ferroelectric Analyzer for many years based on drawing lessons from the most advanced test methods in the world. It has more powerful test functions, the maximum test frequency of the equipment can reach 1MHz, and a high-speed sampling speed of 40M Spend. Some technical indicators exceed imported instruments, which is a real domestic independent innovation. At the same time, the measurement functions of the dielectric spectrum, electric card test, TSDC, resistance and other measurement functions have also been added. It can perform continuous and high-speed measurements under different measurement conditions and measurement modes, and only one Dexinmag ferroelectric instrument can replace the measurement functions of many instruments for functional material testing!

 

 

DX-FTS2 Ferroelectric analyzer DX-FTS3 Ferroelectric analyzer
DX-FTS2 standard type DX-FTS3 Extended Type

 

Measuring Functions:

DHM Dynamic Hysteresis Loop Measurement 
CVM CV Measurement
LM Leakage Current Measurement 
FM Fatigue Measurement
PM Pulse Measurement
PYM Pyroelectric Measurement
DTS Dielectric Thermometry Measurement
RT Resistance Measurement

PZM Piezoelectric Measurement
CHM Static Hysteresis Loop Measurement 
IM Blot Measurement
RM Retention Measurement 
BDM breakdown test
TSDC thermally stimulated current measurement 
ECM electric card test
POM oil bath polarization

 

Technical Parameters

Measurement Parameters

DEXINMAG

Built-in voltage (can be connected to an external high-voltage amplifier)

±10V (Different types of amplifiers can be connected externally)

External high-voltage amplifiers can be connected

(up to 20KV high-voltage amplifiers can be connected with high-voltage protection modules)

±20V, ±100V, ±200V, ±500V, 4KV, 10kV, 20KV

ADC bits

18

Minimum Charge Resolution

<10fC

Minimum Area Resolution

<1μ2

Maximum Charge Resolution

276μC

Maximum Area Resolution

2.76cm2

Maximum Charge Resolution

27.6mC

Maximum Area Resolution

>100cm2

Maximum hysteresis loop test frequency (all indicators are better than imported equipment)

500KHz @10V

500KHz @20V

500KHz @100V

500KHz @200V

500KHz @400V

Minimum Test Frequency

0.03Hz

Minimum pulse width (this index is better than imported equipment)

0.5us

Minimum pulse rise time (5V) (this index is better than imported equipment)

400ns

Maximum pulse width

1s

Maximum delay time between pulses

40ks

Internal Clock

25ns

Minimum Leakage Current (assuming max current integration period = 20 seconds)

<1pA

Maximum small signal upper limit frequency (this index is better than imported equipment)

500KHz

Minimum small signal upper limit frequency (this index is better than imported equipment)

1MHz

Output Rise Time Control

103 scaling

Input Capacitance

~60fF

Impedance input

Yes

 

Measurement Curve ( Part)

Measurement Curve 1 of Ferroelectric Test System

Measurement Curve 2 of Ferroelectric Test System

Measurement Curve 3 of Ferroelectric Test System

 

 


 

Instrument Configuration

Dexinmag FTS series ferroelectric test system is the most advanced equipment in the market, with a wide frequency response range and wide test voltage range, and its high test accuracy capability is second to none in the field of ferroelectric testing in the world. Under the built-in voltage of ±10V, the hysteresis loop test frequency can be as high as 500KHz; (the test index of this instrument has exceeded the imported equipment. For the extended high-voltage amplifier, the maximum test frequency of the hysteresis loop is related to the frequency of the external amplifier.) This system includes Dexinmag basic ferroelectric management test software. In addition, the voltage can be extended externally to 4kV, 10kV, and 20kV. The Dexinmag host can perform hysteresis loop, pulse, leakage current, IV, CV, and breakdown tests without changing the sample connection, and can also be loaded with options to achieve Piezoelectric, pyroelectric, TSDC and electric card, impedance analysis, resistance measurement and other characteristic test functions. Built-in complete dedicated industrial computer host, test circuit, operational amplifier, data processing unit, etc., including dedicated industrial computer motherboard, CPU (i5 or higher), RAM (8G or greater), solid state hard drive (250G or greater), network card, USB interface, DVD drive, VGA interface, pre-installed Windows 7 operating system, special test software for ferroelectric analyzer, etc.

 

Calibration and extension

Calibration Module: Each instrument is equipped with high-precision resistance and capacitance test modules. It can realize the self-calibration of the instrument and make the test data more accurate!

 

Device expansion: High and low-temperature hot and cold tables, high-temperature test equipment, probe stations, high voltage amplifiers, high resistance meters, impedance analyzers, laser interferometer temperature control controllers, digital source meters, etc.

 

Expandable parts:

Expandable parts of ferroelectric material testing system
Block test fixture
For thick film, bulk ferroelectric, breakdown testing
Thin film four-probe probe station
(room temperature to 200℃)
Can be used for thick film ferroelectric, piezoelectric (e31), and pyroelectric testing.
Thin film wide temperature zone probe hot and cold stage
(-196℃ to +600℃)
It can be used for ferroelectric and pyroelectric testing of thin films and thick films with variable temperature.
Thin film probe station
(Room temperature ferroelectric test)
Can be used for room-temperature ferroelectric property testing of thin films and thick films.

 

High voltage amplifier options for bulk materials testing:

High voltage amplifier options for bulk materials testing
DXAM-10KV
Voltage Range: ±10kV 
Current Range: 0-20mA 
Maximum Frequency: 5KHz
Trek 609E-6
Voltage range: ±4kV
Current range: 0-20mA
Frequency max: 6000Hz
Trek 610E
Voltage range: ±10kV
Current range: 0-2mA
Frequency max: 600Hz

 

Piezoelectric testing of thick film and bulk materials (butterfly curve and d33) laser interferometer options:

Piezoelectric testing of thick film and bulk materials (butterfly curve and d33) laser interferometer options

SIOS laser interferometer single-channel optical probe
Resolution min: 0.3nm
Deformation test range: 100nm-2579.50μm

 

Interface

software interface of Ferroelectric Test System

 

 

USB Host Port Universal Serial Bus receptacle, Type A configuration; female; accepts a mouse, keyboard, printer, or USB flash drive.
USB (USBTMC) Interface Port Universal Serial Bus receptacle, Type B configuration (4 direct plug-in ports); female; connectable to an external PC; compatible with USBTMC-USB488 and USB 2.0.LA Test and Measurement Class (TMC) interfaces supporting USB interface communications; IEEE 488.1 and IEEE 488.2 standards.
LAN 10/100/1000 Base T Ethernet, 8-pin configuration; supports automatic selection between two data rates
Video Output 15-pin mini D-Sub connector; female; can drive VGA-compatible monitors

 

 

Analyzer Environmental Indicators

Measuring Circuit Protection

 

Breakdown protection max.
Measurement circuit withstand voltage max value: 25kV

Note: When testing an external TREK high-voltage amplifier, please refer to the high-voltage protection module produced by Dexinmag to protect the TPEK high-voltage amplifier from breakdown.

 

Working Environment

Temperature +5°Cto +40°C
Humidity Wet bulb temperature < +29°C: 20% to 80% (non-condensing)
Altitude 0 to 2,000 meters (0 to 6561 feet)
Vibration 0.21GrmsMax Vibration imum, 5Hz to 500Hz

 

Non-working Environment

Temperature -10°Cto+60°C
Humidity Wet bulb temperature < +40°C: 20% to 90% (non-condensing)
Altitude 0 to 4,572 meters (0 to 15,000 feet )
Vibration 2.09GrmsMax imum, 5Hz to 500Hz

 

 


 

You may also like

 

User Manual of DX-FE2000 Ferroelectric Analyzer

 

The ferroelectric material testing system is mainly used for ferroelectric material hysteresis loop testing, fatigue testing, imprint testing, C-V curve testing, leakage current curve measurement, and dielectric material capacitance measurement.
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