Electrical Properties Measurement System
Many adaptive interfaces have been made with international electrical testing instruments in terms of communication protocols, database processing, and software compatibility. This makes this set of instruments easier to expand in the future, both in terms of software and hardware and saves more time and hardware costs for transformation.
System configuration diagram
| Ferroelectric Analyzer | Ferroelectric parameter analyzer | 1. Ferroelectric parameter analyzer, high voltage amplifier, brake test fixture, system controller, test fixture, displacement sensor, high and low temperature environment combination can realize the ferroelectric performance of functional materials, piezoelectric performance pyroelectric performance test, thermally stimulated polarization current tester TSDC and other functional tests. 2 High and low temperature environment can be equipped with hot and cold tables, high and low temperature test chambers or near-infrared high temperature furnaces. |
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| High voltage amplifier | |||
| Various test fixtures | |||
| High and low temperature environment chamber | |||
| Dielectric temperature spectrum test | Hot and cold stage high temperature furnace | Impedance analyzer | Impedance analyzer with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can realize dielectric temperature spectrum and spectrum measurement of materials. |
| Insulation resistance test | High resistance meter | High resistance meter with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can measure resistance, resistivity, resistance spectrum and other parameters of materials at high and low temperature. | |
| Low resistance test | Low resistance tester | Low resistance meter with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can measure resistance, resistivity, resistance spectrum and other parameters of materials at high and low temperature. | |
| Four-probe test | Source meter | Source meter with high and low temperature environment box, hot and cold stage or near infrared high temperature furnace can measure the conductive properties of semiconductor materials at high and low temperature. | |
| Seebeck coefficient/resistance measurement system | Infrared high temperature furnace | The combination of source meter, infrared high temperature furnace and system controller can realize the evaluation of thermoelectric properties of metal or semiconductor materials. Seebeck coefficient and resistance can be measured with one instrument. | |
| System controller | Temperature control of hot and cold stage or high and low temperature test box, near infrared reflection furnace; acquisition of various voltage, current, switch quantity and displacement signals. | ||
| High voltage polarization power supply | Used for polarization, material breakdown and ceramic flash burning of piezoelectric ceramics and piezoelectric film materials. | ||
| Mechanical in-situ loading device | Used for in-situ loading and other parameter testing and analysis of piezoelectric ceramic materials. | ||
Extensible test device
Test module
01. Ferroelectric parameter test function
- Dynamic Hysteresis;
- Static Hysterestic;
- PUND;
- Fatigue;
- Retention;
- Imprint;
- Leakage current;
- Thermo Measurement.
02 Insulation resistance test function
High-precision voltage output and current measurement ensure the quality of the test, suitable for the detection of functional materials in high-temperature environment data. For example: ceramic materials, silicone rubber testing, PCB, mica, PTFE material resistance testing, and can also be used as a performance test of high-temperature insulation resistance of new materials in scientific research institutes.
03 Piezoelectric parameter test function
It can perform static d33 and other parameter tests on piezoelectric ceramics, and can also measure the piezoelectric coefficient dynamically by using a displacement sensor (such as a calibrator) through high voltage discharge.
04 High-temperature four-probe test function
It meets the diverse needs of testing functional material conductors, semiconductor materials and other new materials in high-temperature environments. The dual-electrical digital four-probe tester uses a straight or square four-probe dual-position measurement. The design of this instrument complies with the national standard of single-crystal silicon physical test methods and refers to the American A.S.T.M standard. It can also be used for product testing and research on the electrical properties of new materials.
05 Pyroelectric test function
Mainly used for temperature-dependent pyroelectric performance testing of thin film and bulk materials. The current method is used to measure the pyroelectric current, pyroelectric coefficient, and residual polarization intensity curves of the material against temperature and time. The temperature range of thin film materials: -196℃~+600℃; the temperature range of bulk materials: room temperature~200℃, room temperature~600℃, room temperature~800°C.
06 Dielectric temperature spectrum test function
It is used to analyze physical quantities such as impedance Z, reactance X, admittance Y, conductance G, susceptance B, inductance L, dielectric loss D, quality factor Q, etc. of functional materials under broadband, high and low temperature environment conditions. At the same time, it can also analyze the curve of the measured sample crystal changing with temperature, frequency, time, and bias voltage. It can also perform Curie temperature test of piezoelectric ceramics.
07 Seebeck coefficient/resistance measurement system
Applicable to the analysis of various thermoelectric properties of various materials such as semiconductors, ceramic materials, metal materials, etc.; thin film measurement options can be set according to user needs, low temperature option temperature range -100℃~200℃, high resistance option up to 10MΩ.
08 Electrocaloric effect test function
- It can be used to test the electrocaloric performance of materials in a wide temperature range.
- Temperature range: -50℃~200℃;
- Heat flow time range: 1s-1000s;
- Maximum voltage can reach 10kV;
- Waveform: user-defined, pulse, triangle wave, sine wave, arbitrary waveform, predefined waveform.
09 Thermally stimulated polarization current tester TSDC
It is used to study some key factors of functional material performance, such as molecular relaxation, phase transition, glass transition temperature, etc. TSDC technology can also be used to more intuitively study the relaxation time, activation energy and other related dielectric properties of materials.
