Wafer Level Magnetic Field Probe Station: Quality Inspection Report
DX1PS3 Wafer Level Automatic In-plane Magnetic Field Probe Station
Product Factory Inspection Report |
Tester |
Project Manager |
|
Robin King |
Thomas Lee |
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Test Date |
2024.12.31 |
Number of products tested |
1 |
Test the temperature and humidity |
23℃/45% |
Test the software version |
V1.0.0.1 |
Conclusion |
Qualified |
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Equipment Status Confirmation: The machine test was completed on December 31, 2024. |
Packing list
Equipment Name: Wafer Level Automatic in-plane Magnetic Field Probe Station |
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Equipment Model: DX1PS3 |
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Serial Number: MPS1DDL01 |
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NO |
ITEM NAME |
SPECIFICATION & MODEL |
QTY |
1 |
Probe station host |
The internal integrated components are as follows: |
1 UNIT |
2 |
Magnet |
DXMP-20/40, input voltage single-phase 220V -50/60Hz; |
1 UNIT |
3 |
Probe Holder |
X/Y/Z stroke is ± 6mm, adjustable resolution is ± 1 micron, vacuum adsorption |
4 SET |
4 |
Probe Fixture |
Leakage accuracy of 10pA, maximum current of 1A, withstand voltage of 700V, maximum frequency of 1MHz, 1.5m triple coaxial cable, BNC standard interface, coaxial male connector |
4 SET |
5 |
DC Probe |
Needle tip diameter of 0.5 microns, capable of measuring a maximum DC 1A |
20 PC(S) |
6 |
Control Computer |
DELL brand, I5CPU, 16GB memory, 256GB solid-state drive+1T mechanical hard drive, 23.8-inch display, English version of Windows system, pre-installed probe station measurement software. |
1 SET |
7 |
Oil-free Vacuum Pump |
VP0125, Input voltage single-phase 220V -50/60Hz, flow rate 7L/min |
1 SET |
8 |
Single Tube Microscope |
Input voltage single-phase 220V -50/60Hz, high-definition imaging with continuous zoom and no need to change the working height, coaxial lighting, working distance>80mm, 3mm micro focus, larger magnification 0.75X~5X, camera frame rate 30 frames, USB 2.0 output, 5 million pixels, supports manual/automatic RGB adjustment white balance, 13-inch display. |
1 SET |
9 |
Air floating Platform |
Table size 800mm*1200mm, including air pump, input voltage single-phase 220V -50/60Hz |
1 SET |
10 |
Recirculating Cooler(Chiller) |
Input voltage single-phase 220V -50/60Hz, cooling capacity 1200W |
1 SET |
11 |
Cooling Fluid |
|
25KG |
12 |
Microscope Calibration Fixture |
|
1 EA |
13 |
Product Manual |
|
1 PC(S) |
1. Routine - item Inspection
Testing Items |
Requirements |
Method |
Frequency |
Conclusion |
Determination |
1.1 Appearance Examination |
It has a clean and tidy appearance, and the color is integrated as a whole |
visual inspection |
100% |
Qualified |
Y |
1.2 Inspection of Parts |
The overall structure is stable and the connection of each component is smooth |
Visual and Manual Operation Inspection |
100% |
Qualified |
Y |
1.3 Inspection of Electrical Systems |
The electrical connections are safe enough |
Visual and Manual Operation Inspection |
100% |
Qualified |
Y |
1.4 Inspection of Parts |
The software operates smoothly without any lagging or stuttering |
Visual and Manual Operation Inspection |
100% |
Qualified |
Y |
2. Security Inspection
Testing Items |
Requirements |
Method |
Frequency |
Conclusion |
Determination |
2.1 |
The magnet temperature control stops the power supply automatically when the temperature exceeds 65°C and the software alarms |
Visual and Manual Operation Inspection |
100% |
Qualified |
Y |
2.2 |
It has warning signs such as "Caution: Magnetic Field". |
Visual and Manual Operation Inspection |
100% |
Qualified |
Y |
2.3 |
The water cooling machine has been running in circulation for more than 48 hours, and no water leakage has been observed. |
Visual and Manual Operation Inspection |
48h |
Qualified |
Y |
3. Optical Component Inspection
Testing Items |
Requirements |
Method |
Frequency |
Conclusion |
determination |
3.1 |
The microscope is working properly. |
Visual inspection |
100% |
Qualified |
Y |
4. Magnetic field test
Testing Items |
Requirements |
Method |
Frequency |
Conclusion |
Determination |
4.1 |
The magnetic field intensity is higher than 330 mT |
test with gaussmeter |
100% |
Qualified |
Y |
4.2 |
The magnetic field homogeneity is better than 1% within a diameter of 1 mm
|
Software - Program Control and Gaussmeter Testing |
100% |
Qualified |
Y |
4.3 |
The magnetic field resolution is better than 0.02 mT |
Software - Program Control and Gaussmeter Testing |
100% |
Qualified |
Y |
4.4 |
have the function of measuring magnetic hysteresis loop |
Software - Program Control and Gaussmeter Testing |
100% |
Qualified |
Y |
Test interface of Magnetoresistance
Notes:
1. The test data shall not be modified or obliterated.
2 .Use "Y" to represent the test conclusion; use "N" to represent unqualified.
Wafer Level Automatic In-plane Magnetic Field Probe Station