DX-70 Hall Measurement System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices and the electrical properties of semiconductor materials.
DX-100 Hall Effect Measurement Equipment consists of an electromagnet, electromagnet power supply, high precision constant current source, high precision voltmeter, Hall effect sample holder, standard sample and system software.
DX-30 Permanent Magnet Hall Effect Meter consists of a permanent magnet, a high-precision constant current source high-precision voltmeter, a Hall effect sample holder, a standard sample, a high-precision Gauss meter and system software.
DX-1000L Low Temperature Hall Effect Test System consists of an electromagnet, electromagnet power supply, high-precision constant current source and high-precision voltmeter, Hall effect sample holder, standard sample, high and low temperature Dewar, temperature controller, and system software.
DX-1000H High Temperature Hall Measurement Setup consists of an electromagnet, a vacuum pump, a high-temperature vacuum chamber, a Gauss meter, a constant current source, an electromagnet current source, a temperature controller, a computer and software. The hall effect measurement system measures Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, and Magnetoresistance.